Abstract: High-throughput functional testing of silicon photonics is a key challenge for scalable manufacturing. We present a technique for wafer-scale testing using high-density edge couplers that add excess loss of <2. 2dB without requiring additional footprint. Silicon photonics has drawn increasing attention in the past few decades and is a promising key technology for future daily applications due to its various merits including ultra-low cost, high integration density owing to the high refractive index of silicon, and compatibility with current. At FormFactor, our engineers have collaborated with IHP Microelectronics to develop the industry's first fully automated wafer-level edge coupling measurement system designed specifically for silicon photonic integrated circuits (PICs). OCIS codes:. This study introduces low-loss coupling strategies and their implementation for a silicon nitride integrated platform. This system integrates state-of-the-art technologies, including optical probes, advanced alignment algorithms, and.
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